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AFM探針
高分辨率 AFM用于具有挑戰(zhàn)性的前沿研究
篩選探針
篩選
清空
Spring Constant
<0.1N/m (30)
0.1-1N/m (75)
1.1-5N/m (46)
5.1-20N/m (9)
20.1-50N/m (73)
50.1-200N/m (7)
>200N/m (7)
Resonance Frequency
5KHz (1)
7KHz (12)
8KHz (1)
9KHz (1)
10KHz (5)
11KHz (2)
13KHz (10)
15KHz (12)
18KHz (17)
19KHz (1)
20KHz (5)
22KHz (13)
23KHz (13)
24KHz (2)
25KHz (0)
34KHz (2)
37KHz (1)
38KHz (12)
40KHz (10)
42KHz (1)
50KHz (1)
55KHz (4)
56KHz (13)
60KHz (3)
65KHz (15)
70KHz (12)
71KHz (3)
73KHz (2)
75KHz (23)
77KHz (1)
100KHz (2)
105KHz (1)
110KHz (3)
125KHz (12)
130KHz (3)
150KHz (8)
165KHz (1)
180KHz (2)
190KHz (11)
280KHz (1)
292KHz (13)
293KHz (3)
300KHz (13)
320KHz (31)
350KHz (4)
450KHz (2)
525KHz (5)
1400KHz (1)
Cantilever Length
16um (2)
27um (1)
30um (1)
36um (3)
38um (1)
42um (2)
60um (4)
70um (2)
75um (2)
85um (10)
97um (3)
100um (5)
110um (4)
115um (4)
117um (6)
120um (11)
123um (4)
125um (57)
130um (2)
140um (10)
150um (7)
160um (1)
170um (2)
175um (11)
197um (3)
200um (11)
205um (11)
210um (10)
215um (2)
225um (49)
230um (5)
240um (2)
300um (13)
305um (1)
310um (10)
350um (6)
397um (3)
400um (2)
450um (25)
465um (1)
Cantilever Geometry
Rectangular (173)
Rectangular & Triangular (12)
Special (22)
Triangular (26)
Cantilever Coating
40 ± 10nm of Al (1)
B: Drift Compensated Reflective Gold (1)
B: Proprietary reflective coating (3)
B: Reflective Al (1)
B: Reflective Aluminum (93)
B: Reflective Au (7)
B: Reflective CoCr (7)
B: Reflective Gold (31)
B: Reflective PtIr (5)
B: TiW/Au (500) (2)
F: Conductive Diamond (4)
F: Conductive Platinum (1)
F: Conductive PtIr (5)
F: Conductive PtSi (1)
F: Diamond-Like Carbon (2)
F: Gold (3)
F: Magnetic CoCr (8)
F: Wear resistant carbon (5)
Cantilever Material
0.01 - 0.02 Ωcm Antimony (n) doped Si (1)
0.01 - 0.02 Ωcm Silicon (3)
0.01 - 0.025 Ωcm Antimony (n) doped Si (119)
0.01 - 0.02Ωcm Antimony (n) doped Si (1)
0.010 - 0.025 Ωcm Silicon (14)
1 Ωcm Silicon (3)
Electrochemically Etched Wire (1)
Nickel (1)
Precision Cut Wire (1)
Silicon (9)
Silicon Nitride (51)
Single Crystal Diamond (4)
Solid Platinum (4)
Stainless Steel (7)
Tip Radius(Nom)
*1nm typical electrical resolution. (1)
<100nm (3)
<20nm (4)
<30nm (6)
<5nm (2)
10 ± 5nm (2)
100nm (4)
10nm (29)
15nm (6)
18nm (2)
1nm (5)
20nm (14)
25nm (7)
2nm (10)
30nm (8)
35nm (3)
40nm (8)
50 ± 10nm (2)
50nm (1)
5nm (9)
7nm (7)
80nm (1)
8nm (65)
Tip Geometry
Conical (5)
Critical Dimension (Overhang) (14)
High Aspect Ratio (19)
Pyramid (7)
Pyramidal (2)
Rotated (13)
Rotated (Symmetric) (85)
Solid Wire (14)
Standard (5)
Standard (Steep) (46)
Super Sharp (2)
Tipless (7)
Visible Apex (13)
Tip Coating
Amorphous Carbon (3)
Carbon Coated (2)
Conductive Diamond (4)
Conductive Platinum (1)
Conductive PtIr (1)
Conductive PtSi (1)
Diamond-Like Carbon (2)
gold (3)
Hand-crafted natural diamond Nanoindenting tip (7)
Highly conductive single crystal diamond (4)
Magnetic (8)
no tip coating (0)
Platinum/ Iridium (1)
PtIr (2)
TiW (2)
Tip Height
1.5-4.5um (2)
10-15um (110)
10-20um (13)
10um (3)
12.5±2.5um (4)
12.5um (2)
14-16um (3)
2-5um (1)
2.5-3.5um (4)
2.5-4.5um (2)
2.5-8.0um (28)
3-6um (6)
3-8um (9)
4-10um (4)
4.5-5.5um (2)
5-10um (1)
5-7um (1)
50um (7)
5um (1)
7-11um (1)
8-15um (1)
9-12um (2)
9-19um (3)
約100um (4)
Number Of Cantilevers
1個懸臂 (198)
2個懸臂 (5)
3個懸臂 (4)
4個懸臂 (13)
6個懸臂 (12)
Sample
Bio Molecules (46)
Cells (35)
Ceramics (128)
Data Storage (76)
Other Hard Samples (145)
Other Soft Sample (139)
Polymers (139)
Semiconductors (102)
Afm
BioScopeResolve (14)
Data Storage (0)
DimensionFastScan (50)
DimensionIcon (185)
DimensionXR (180)
Innova (154)
Insight (62)
JPK (141)
MultiMode (150)
Non-Bruker (136)
Semiconductors (0)
Work Mode
AFM-nDMA (2)
CAFM (18)
contact (65)
contact resonance (3)
Critical Dimension (CD) AFM (15)
Deep Trench (DT) (8)
EFM (19)
Electrical Spectroscopy (15)
FAST SCAN (6)
Force spectroscopy (34)
HarmoniX (2)
KPFM (20)
LFM (8)
MFM (8)
Nanoindentation (11)
NanoScale TA (6)
PeakForce Deep Trench (3)
PeakForce QNM (25)
PeakForce QNM High-Accuracy (4)
peakforce tapping (63)
PeakForce TUNA (8)
PFM (19)
ScanAsyst (10)
SCM (13)
sMIM (2)
SSRM (10)
sthM (3)
STM (9)
tapping or non-contact (125)
TERS (2)
Torsional Resonance (TR) (13)
TUNA (14)
Application
Electrical (38)
Fluid Imaging (41)
General Topography (121)
Holes/ Trenches (42)
Mechanical Force Curves (70)
Mechanical Property Mapping (40)
nanoindenting/nanoscratching applications (1)
probe for calibration (2)
Pulling (35)
suitable for tip modification (8)
Ultra Hi-Res (17)
每頁顯示
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條記錄
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PT10
對比
Frequency
Nom
:
Spring Const.
Nom
:
Geometry
Special
Tip Radius
Material
Coating
RESP-10
對比
Frequency
Nom
: 10KHz
Spring Const.
Nom
: 0.1N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
RESP-20
對比
Frequency
Nom
: 20KHz
Spring Const.
Nom
: 0.9N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
RESP-40
對比
Frequency
Nom
: 40KHz
Spring Const.
Nom
: 5N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
RESPA-10
對比
Frequency
Nom
: 10KHz
Spring Const.
Nom
: 0.1N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
RESPA-20
對比
Frequency
Nom
: 20KHz
Spring Const.
Nom
: 0.9N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
RESPA-40
對比
Frequency
Nom
: 40KHz
Spring Const.
Nom
: 5N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
RESPAW-10
對比
Frequency
Nom
: 10KHz
Spring Const.
Nom
: 0.1N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
RESPAW-20
對比
Frequency
Nom
: 20KHz
Spring Const.
Nom
: 0.9N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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探針對比
探針型號對比
添加型號
開始對比
最多4個
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