AFM探針描述
適用的Sample:
適用的AFM機型:
Innova
適用的Work Mode:
contact,Force spectroscopy,peakforce tapping,tapping or non-contact
適用的Application:
Fluid Imaging,General Topography,Mechanical Force Curves,Mechanical Property Mapping,Pulling
Coating 描述
cantilever Back side coating | Reflective gold |
---|---|
tip coating | -- |
Tip 規(guī)格
tip geometry | Rotated (Symmetric) |
---|---|
tip radius (Nom) | 10nm |
tip height | 2.5-8.0um |
Front Angle (FA) | 15±2.5° |
Back Angle (BA) | 25±2.5° |
Side Angle (SA) | 17.5±2.5° |
Cantilever 規(guī)格
cantilever geometry | Triangular |
---|---|
K(Nom) | 0.07N/m |
Frequency(Nom) | 22KHz |
length(Nom) | 175um |
thickness(Nom) | 0.55um |
cantilever material | Silicon Nitride |
top layer back | 45±5 nm of Ti/Au |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum