NP-W-UC
  • Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 4個懸臂
    F65KHz K0.35N/m L120um
    F23KHz K0.12N/m L205um
    F56KHz K0.24N/m L120um
    F18KHz K0.06N/m L205um
AFM探針描述

適用的Sample:
Bio Molecules,Cells,Other Soft Sample,Polymers

適用的AFM機型:
Innova,JPK,MultiMode

適用的Work Mode:
contact,Force spectroscopy,peakforce tapping,tapping or non-contact

適用的Application:
Fluid Imaging,General Topography,Mechanical Force Curves,Pulling

Coating 描述
tip coating --
Tip 規(guī)格
tip geometry Rotated (Symmetric)
tip radius (Nom) 20nm
tip height 2.5-8.0um
Front Angle (FA) 15±2.5°
Back Angle (BA) 25±2.5°
Side Angle (SA) 17.5±2.5°
Cantilever 規(guī)格
cantilever geometry Triangular
K(Nom) 0.35N/m,0.12N/m,0.24N/m,0.06N/m
Frequency(Nom) 65KHz,23KHz,56KHz,18KHz
length(Nom) 120um,205um,120um,205um
thickness(Nom) 0.6um
cantilever material Silicon Nitride
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對比
探針型號對比
開始對比 最多4個
清空