• Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 1個(gè)懸臂
    F20KHz K0.9N/m L450um
AFM探針描述

適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors

適用的AFM機(jī)型:
DimensionFastScan,DimensionIcon,DimensionXR,Innova,Insight,JPK,MultiMode,Non-Bruker

適用的Work Mode:
contact

適用的Application:
General Topography

Coating 描述
tip coating --
Tip 規(guī)格
tip geometry Rotated (Symmetric)
tip radius (Nom) 8nm
tip height 10-15um
Front Angle (FA) 15±2°
Back Angle (BA) 25±2°
Side Angle (SA) 17.5±2°
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 0.9N/m
Frequency(Nom) 20KHz
length(Nom) 450um
thickness(Nom) 3.25um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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