適用的Sample:
Ceramics,Other Hard Samples,Polymers,Semiconductors
適用的AFM機(jī)型:
BioScopeResolve,DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
CAFM,contact,Nanoindentation,PeakForce QNM,peakforce tapping,PeakForce TUNA,tapping or non-contact,TUNA
適用的Application:
Electrical,General Topography,Mechanical Force Curves,Mechanical Property Mapping
| cantilever Back side coating | Reflective Au |
|---|---|
| tip coating | Highly conductive single crystal diamond |
| tip geometry | Standard |
|---|---|
| tip radius (Nom) | 10 ± 5nm |
| tip height | 12.5±2.5um |
| Front Angle (FA) | 25±5° |
| Back Angle (BA) | 15±5° |
| Side Angle (SA) | 22.5±5° |
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 40N/m |
| Frequency(Nom) | 180KHz |
| length(Nom) | 225um |
| thickness(Nom) | 3.0um |
| cantilever material | Single Crystal Diamond |
| top layer back | -- |
