• Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Critical Dimension (Overhang)
  • Number of Cantilevers: 1個(gè)懸臂
    F292KHz K35N/m L125um
AFM探針描述

適用的Sample:
Data Storage,Other Hard Samples,Semiconductors

適用的AFM機(jī)型:
Insight

適用的Work Mode:
Critical Dimension (CD) AFM

適用的Application:
Holes/ Trenches

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Critical Dimension (Overhang)
tip radius (Nom) --
tip height 10-20um
Overhang 13-25nm
Effective Length 1000-1500nm
Tip Width 200-300nm
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 35N/m
Frequency(Nom) 292KHz
length(Nom) 125um
thickness(Nom) 3.3um
cantilever material 0.010 - 0.025 Ωcm Silicon
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探針對(duì)比
探針型號(hào)對(duì)比
添加型號(hào)
開始對(duì)比 最多4個(gè)
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