AFM探針描述
適用的Sample:
Data Storage,Other Hard Samples,Semiconductors
適用的AFM機型:
Insight
適用的Work Mode:
Critical Dimension (CD) AFM
適用的Application:
Holes/ Trenches
Coating 描述
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
Tip 規(guī)格
| tip geometry | Critical Dimension (Overhang) |
|---|---|
| tip radius (Nom) | -- |
| tip height | 10-20um |
| Overhang | 100-150nm |
| Effective Length | 5000-7500nm |
| Tip Width | 650-850nm |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 35N/m |
| Frequency(Nom) | 292KHz |
| length(Nom) | 125um |
| thickness(Nom) | 3.3um |
| cantilever material | 0.010 - 0.025 Ωcm Silicon |
| top layer back | -- |
最新產品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
