AFM探針描述
適用的Sample:
Ceramics,Data Storage,Other Hard Samples,Polymers,Semiconductors
適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
EFM,Electrical Spectroscopy,KPFM,PFM,SSRM
適用的Application:
Electrical
Coating 描述
cantilever Front side coating | Conductive Diamond |
---|---|
cantilever Back side coating | Reflective Aluminum |
tip coating | Conductive Diamond |
Tip 規(guī)格
tip geometry | Standard (Steep) |
---|---|
tip radius (Nom) | 100nm |
tip height | 10-15um |
Front Angle (FA) | 25±2.5° |
Back Angle (BA) | 17.5±2.5° |
Side Angle (SA) | 20±2.5° |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 80N/m |
Frequency(Nom) | 450KHz |
length(Nom) | 125um |
thickness(Nom) | 3.6um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum