FASTSCAN-A
  • Manufacturer: Bruker
  • Cantilever Coating: B: Reflective Aluminum
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 1個(gè)懸臂
    F1400KHz K18N/m L27um
AFM探針描述

適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers

適用的AFM機(jī)型:
DimensionFastScan

適用的Work Mode:
FAST SCAN

適用的Application:
General Topography

Coating 描述
cantilever Back side coating Reflective Aluminum
tip coating --
Tip 規(guī)格
tip geometry Rotated (Symmetric)
tip radius (Nom) 5nm
tip height 2.5-8.0um
Front Angle (FA) 15±2.5°
Back Angle (BA) 25±2.5°
Side Angle (SA) 17.5±2.5°
Cantilever 規(guī)格
cantilever geometry Triangular
K(Nom) 18N/m
Frequency(Nom) 1400KHz
length(Nom) 27um
thickness(Nom) 0.58um
cantilever material Silicon Nitride
top layer back 100 ±10 nm of Al
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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