• Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: High Aspect Ratio
  • Number of Cantilevers: 1個(gè)懸臂
    F320KHz K42N/m L125um
AFM探針描述

適用的Sample:
Data Storage,Semiconductors

適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Insight

適用的Work Mode:
tapping or non-contact

適用的Application:
General Topography,Holes/ Trenches,Ultra Hi-Res

Coating 描述
tip coating --
Tip 規(guī)格
tip geometry High Aspect Ratio
tip radius (Nom) 10nm
tip height 10-15um
Front Angle (FA) 2±0.5°
Back Angle (BA) 2±0.5°
Side Angle (SA) 2±0.5°
Spike Height 1500nm
Spike Width 100nm
Cantilever 規(guī)格
cantilever geometry Rectangular
K(Nom) 42N/m
Frequency(Nom) 320KHz
length(Nom) 125um
thickness(Nom) 4um
cantilever material 0.01 - 0.025 Ωcm Antimony (n) doped Si
top layer back --
最新產(chǎn)品
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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