高縱橫比探針（High Aspect Ratio Probes），用于tapping mode測(cè)量和小特征測(cè)量，高長(zhǎng)寬比“超級(jí)圓錐（Super Cone）”conical探針。
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers
適用的AFM機(jī)型:
DimensionIcon,DimensionXR,Innova,Non-Bruker
適用的Work Mode:
tapping or non-contact
適用的Application:
General Topography,Holes/ Trenches
| cantilever Back side coating | Reflective Aluminum |
|---|---|
| tip coating | -- |
| tip geometry | Conical |
|---|---|
| tip radius (Nom) | 8nm |
| tip height | 7-11um |
| Front Angle (FA) | 10± 2° |
| Back Angle (BA) | 10±2° |
| Side Angle (SA) | 10±2° |
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 35N/m |
| Frequency(Nom) | 350KHz |
| length(Nom) | 125um |
| thickness(Nom) | 4um |
| cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
| top layer back | 40 ±10 nm of Al |
