AFM探針描述
適用的Sample:
Ceramics,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
適用的AFM機型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
適用的Work Mode:
CAFM,EFM,Electrical Spectroscopy,KPFM,PFM,SCM,TUNA
適用的Application:
Electrical
Coating 描述
| tip coating | -- |
|---|
Tip 規(guī)格
| tip geometry | Solid Wire |
|---|---|
| tip radius (Nom) | <20nm |
| tip height | 約100um |
Cantilever 規(guī)格
| cantilever geometry | Rectangular |
|---|---|
| K(Nom) | 18N/m |
| Frequency(Nom) | 20KHz |
| length(Nom) | 300um |
| thickness(Nom) | -- |
| cantilever material | Solid Platinum |
| top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
