AFM探針描述
適用的Sample:
Bio Molecules,Ceramics,Data Storage,Other Hard Samples,Other Soft Sample,Polymers,Semiconductors
適用的AFM機型:
DimensionIcon,DimensionXR
適用的Work Mode:
PeakForce QNM,PeakForce QNM High-Accuracy,peakforce tapping,ScanAsyst
適用的Application:
General Topography,Mechanical Property Mapping
Coating 描述
cantilever Back side coating | Reflective Aluminum |
---|---|
tip coating | -- |
Tip 規(guī)格
tip geometry | Rotated |
---|---|
tip radius (Nom) | 30nm |
tip height | 3-8um |
Front Angle (FA) | 15° |
Back Angle (BA) | 25° |
Cantilever 規(guī)格
cantilever geometry | Special |
---|---|
K(Nom) | 0.25N/m |
Frequency(Nom) | 55KHz |
length(Nom) | 110um |
thickness(Nom) | 0.58um |
cantilever material | Silicon Nitride |
top layer back | -- |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum