AFM探針描述
適用的Sample:
Other Hard Samples,Semiconductors
適用的AFM機型:
DimensionIcon,DimensionXR,Non-Bruker
適用的Work Mode:
tapping or non-contact
適用的Application:
Holes/ Trenches
Coating 描述
cantilever Back side coating | Reflective Aluminum |
---|---|
tip coating | -- |
Tip 規(guī)格
tip geometry | High Aspect Ratio |
---|---|
tip radius (Nom) | 10nm |
tip height | 10-15um |
Front Angle (FA) | 5±1° |
Back Angle (BA) | 5±1° |
Side Angle (SA) | 5±1° |
Spike Height | 4500nm |
Spike Width | 200nm |
Cantilever 規(guī)格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 42N/m |
Frequency(Nom) | 320KHz |
length(Nom) | 125um |
thickness(Nom) | 4um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | 45±5 nm of Al |
最新產(chǎn)品
Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum